Lyu, S., Zhang, R., Ma, Z., Liao, F., Mo, D., & Wong, W. (2025). MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context. Proceedings of the AAAI Conference on Artificial Intelligence, 39(6), 5937–5945. https://doi.org/10.1609/aaai.v39i6.32634