[1]
Robitaille, L.- Émile, Durand, A., Gardner, M.-A., Gagné, C., De Koninck, P. and Lavoie-Cardinal, F. 2018. Learning to Become an Expert: Deep Networks Applied to Super-Resolution Microscopy. Proceedings of the AAAI Conference on Artificial Intelligence. 32, 1 (Apr. 2018).