Pan, W. et al. 2025. Enhanced Sample Selection with Confidence Tracking: Identifying Correctly Labeled Yet Hard-to-Learn Samples in Noisy Data. Proceedings of the AAAI Conference on Artificial Intelligence. 39, 19 (Apr. 2025), 19795–19803. DOI:https://doi.org/10.1609/aaai.v39i19.34180.