[1]
Yao, X., Zhang, C., Li, R., Sun, J. and Liu, Z. 2023. One-for-All: Proposal Masked Cross-Class Anomaly Detection. Proceedings of the AAAI Conference on Artificial Intelligence. 37, 4 (Jun. 2023), 4792-4800. DOI:https://doi.org/10.1609/aaai.v37i4.25604.