Online Metric Learning for Multi-Label Classification

Authors

  • Xiuwen Gong The University of Sydney
  • Dong Yuan The University of Sydney
  • Wei Bao The University of Sydney

DOI:

https://doi.org/10.1609/aaai.v34i04.5818

Abstract

Existing research into online multi-label classification, such as online sequential multi-label extreme learning machine (OSML-ELM) and stochastic gradient descent (SGD), has achieved promising performance. However, these works lack an analysis of loss function and do not consider label dependency. Accordingly, to fill the current research gap, we propose a novel online metric learning paradigm for multi-label classification. More specifically, we first project instances and labels into a lower dimension for comparison, then leverage the large margin principle to learn a metric with an efficient optimization algorithm. Moreover, we provide theoretical analysis on the upper bound of the cumulative loss for our method. Comprehensive experiments on a number of benchmark multi-label datasets validate our theoretical approach and illustrate that our proposed online metric learning (OML) algorithm outperforms state-of-the-art methods.

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Published

2020-04-03

How to Cite

Gong, X., Yuan, D., & Bao, W. (2020). Online Metric Learning for Multi-Label Classification. Proceedings of the AAAI Conference on Artificial Intelligence, 34(04), 4012-4019. https://doi.org/10.1609/aaai.v34i04.5818

Issue

Section

AAAI Technical Track: Machine Learning