Beyond Superficial Forgetting: Thorough Unlearning Through Knowledge Density Estimation and Block Re-Insertion

Authors

  • Feng Guo University of Electronic Science and Technology of China
  • Yuntao Wen University of Electronic Science and Technology of China
  • Shen Gao University of Electronic Science and Technology of China
  • Junshuo Zhang University of Electronic Science and Technology of China
  • Shuo Shang University of Electronic Science and Technology of China State Key Laboratory of AI Safety, Beijing, 100086

DOI:

https://doi.org/10.1609/aaai.v40i36.40343

Abstract

Machine unlearning, which selectively removes harmful knowledge from a pre-trained model without retraining from scratch, is crucial for addressing privacy, regulatory compliance, and ethical concerns in Large Language Models (LLMs). However, existing unlearning methods often struggle to thoroughly remove harmful knowledge, leaving residual harmful knowledge that can be easily recovered. To address these limitations, we propose Knowledge Density-Guided Unlearning via Blocks Reinsertion (KUnBR), a novel approach that first identifies layers with rich harmful knowledge and then thoroughly eliminates the harmful knowledge via re-insertion strategy. Our method introduces knowledge density estimation to quantify and locate layers containing the most harmful knowledge, enabling precise unlearning. Additionally, we design a layer re-insertion strategy that extracts and re-inserts harmful knowledge-rich layers into the original LLM, bypassing gradient obstruction caused by cover layers and ensuring effective gradient propagation during unlearning. Extensive experiments conducted on several unlearning and general capability benchmarks demonstrate that KUnBR achieves state-of-the-art forgetting performance while maintaining model utility.

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Published

2026-03-14

How to Cite

Guo, F., Wen, Y., Gao, S., Zhang, J., & Shang, S. (2026). Beyond Superficial Forgetting: Thorough Unlearning Through Knowledge Density Estimation and Block Re-Insertion. Proceedings of the AAAI Conference on Artificial Intelligence, 40(36), 30852–30860. https://doi.org/10.1609/aaai.v40i36.40343

Issue

Section

AAAI Technical Track on Natural Language Processing I