From Attribution to Action: Jointly ALIGNing Predictions and Explanations

Authors

  • Dongsheng Hong Fuzhou University
  • Chao Chen Harbin Institute of Technology
  • Yanhui Chen Fuzhou University
  • Shanshan Lin Fuzhou University
  • Zhihao Chen Fuzhou University
  • Xiangwen Liao Fuzhou University

DOI:

https://doi.org/10.1609/aaai.v40i26.39324

Abstract

Explanation-guided learning (EGL) has shown promise in aligning model predictions with interpretable reasoning, particularly in computer vision tasks. However, most approaches rely on external annotations or heuristic-based segmentation to supervise model explanations, which can be noisy, imprecise and difficult to scale. In this work, we provide both empirical and theoretical evidence that low-quality supervision signals can degrade model performance rather than improve it. In response, we propose ALIGN, a novel framework that jointly trains a classifier and a masker in an iterative manner. The masker learns to produce soft, task-relevant masks that highlight informative regions, while the classifier is optimized for both prediction accuracy and alignment between its saliency maps and the learned masks. By leveraging high-quality masks as guidance, ALIGN improves both interpretability and generalizability, showing its superiority across various settings. Experiments on the two domain generalization benchmarks, VLCS and Terra Incognita, show that ALIGN consistently outperforms six strong baselines in both in-distribution and out-of-distribution settings. Besides, ALIGN also yields superior explanation quality concerning sufficiency and comprehensiveness, highlighting its effectiveness in producing accurate and interpretable models.

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Published

2026-03-14

How to Cite

Hong, D., Chen, C., Chen, Y., Lin, S., Chen, Z., & Liao, X. (2026). From Attribution to Action: Jointly ALIGNing Predictions and Explanations. Proceedings of the AAAI Conference on Artificial Intelligence, 40(26), 21735–21742. https://doi.org/10.1609/aaai.v40i26.39324

Issue

Section

AAAI Technical Track on Machine Learning III