Detecting Unobserved Confounders: A Kernelized Regression Approach

Authors

  • Yikai Chen National University of Defense Technology
  • Yunxin Mao National University of Defense Technology
  • Chunyuan Zheng Peking University
  • Hao Zou Tsinghua University
  • Shanzhi Gu National University of Defense Technology
  • Shixuan Liu National University of Defense Technology
  • Yang Shi Peking University
  • Wenjing Yang National University of Defense Technology
  • Kun Kuang Zhejiang University
  • Haotian Wang National University of Defense Technology

DOI:

https://doi.org/10.1609/aaai.v40i24.39127

Abstract

Detecting unobserved confounders is crucial for reliable causal inference in observational studies. Existing methods require either linearity assumptions or multiple heterogeneous environments, limiting applicability to nonlinear single-environment settings. To bridge this gap, we propose Kernel Regression Confounder Detection (KRCD), a novel method for detecting unobserved confounding in nonlinear observational data under single-environment conditions. KRCD leverages reproducing kernel Hilbert spaces to model complex dependencies. By comparing standard and higher-order kernel regressions, we derive a test statistic whose significant deviation from zero indicates unobserved confounding. Theoretically, we prove two key results: First, in infinite samples, regression coefficients coincide if and only if no unobserved confounders exist. Second, finite-sample differences converge to zero-mean Gaussian distributions with tractable variance. Extensive experiments on synthetic benchmarks and the Twins dataset demonstrate that KRCD not only outperforms existing baselines but also achieves superior computational efficiency.

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Published

2026-03-14

How to Cite

Chen, Y., Mao, Y., Zheng, C., Zou, H., Gu, S., Liu, S., Shi, Y., Yang, W., Kuang, K., & Wang, H. (2026). Detecting Unobserved Confounders: A Kernelized Regression Approach. Proceedings of the AAAI Conference on Artificial Intelligence, 40(24), 20381-20389. https://doi.org/10.1609/aaai.v40i24.39127

Issue

Section

AAAI Technical Track on Machine Learning I