Promptable Anomaly Segmentation with SAM Through Self-Perception Tuning

Authors

  • Hui-Yue Yang School of Software, Tsinghua University
  • Hui Chen BNRist, Tsinghua University
  • Ao Wang School of Software, Tsinghua University
  • Kai Chen School of Software, Tsinghua University
  • Zijia Lin School of Software, Tsinghua University
  • Yongliang Tang LUSTER LightTech Co., Ltd.
  • Pengcheng Gao LUSTER LightTech Co., Ltd.
  • Yuming Quan LUSTER LightTech Co., Ltd.
  • Jungong Han Department of Automation, Tsinghua University
  • Guiguang Ding School of Software, Tsinghua University

DOI:

https://doi.org/10.1609/aaai.v39i12.33420

Abstract

Segment Anything Model (SAM) has made great progress in anomaly segmentation tasks due to its impressive generalization ability. However, existing methods that directly apply SAM through prompting often overlook the domain shift issue, where SAM performs well on natural images but struggles in industrial scenarios. Parameter-Efficient Fine-Tuning (PEFT) offers a promising solution, but it may yield suboptimal performance by not adequately addressing the perception challenges during adaptation to anomaly images. In this paper, we propose a novel Self-Perception Tuning (SPT) method, aiming to enhance SAM's perception capability for anomaly segmentation. The SPT method incorporates a self-drafting tuning strategy, which generates an initial coarse draft of the anomaly mask, followed by a refinement process. Additionally, a visual-relation-aware adapter is introduced to improve the perception of discriminative relational information for mask generation. Extensive experimental results on several benchmark datasets demonstrate that our SPT method can significantly outperform baseline methods, validating its effectiveness.

Published

2025-04-11

How to Cite

Yang, H.-Y., Chen, H., Wang, A., Chen, K., Lin, Z., Tang, Y., … Ding, G. (2025). Promptable Anomaly Segmentation with SAM Through Self-Perception Tuning. Proceedings of the AAAI Conference on Artificial Intelligence, 39(12), 13017–13025. https://doi.org/10.1609/aaai.v39i12.33420

Issue

Section

AAAI Technical Track on Data Mining & Knowledge Management II