SUMI-IFL: An Information-Theoretic Framework for Image Forgery Localization with Sufficiency and Minimality Constraints

Authors

  • Ziqi Sheng SUN YAT-SEN UNIVERSITY
  • Wei Lu SUN YAT-SEN UNIVERSITY
  • Xiangyang Luo Information Engineering University
  • Jiantao Zhou University of Macau
  • Xiaochun Cao SUN YAT-SEN UNIVERSITY

DOI:

https://doi.org/10.1609/aaai.v39i1.32054

Abstract

Image forgery localization (IFL) is a crucial technique for preventing tampered image misuse and protecting social safety. However, due to the rapid development of image tampering technologies, extracting more comprehensive and accurate forgery clues remains an urgent challenge. To address these challenges, we introduce a novel information-theoretic IFL framework named SUMI-IFL that imposes sufficiency-view and minimality-view constraints on forgery feature representation. First, grounded in the theoretical analysis of mutual information, the sufficiency-view constraint is enforced on the feature extraction network to ensure that the latent forgery feature contains comprehensive forgery clues. Considering that forgery clues obtained from a single aspect alone may be incomplete, we construct the latent forgery feature by integrating several orthogonal individual image features. Second, based on the information bottleneck, the minimality-view constraint is imposed on the feature reasoning network to achieve an accurate and concise forgery feature representation that counters the interference of task-unrelated features. Extensive experiments show the superior performance of SUMI-IFL to existing state-of-the-art methods, not only on in-dataset comparisons but also on cross-dataset comparisons.

Published

2025-04-11

How to Cite

Sheng, Z., Lu, W., Luo, X., Zhou, J., & Cao, X. (2025). SUMI-IFL: An Information-Theoretic Framework for Image Forgery Localization with Sufficiency and Minimality Constraints. Proceedings of the AAAI Conference on Artificial Intelligence, 39(1), 720–728. https://doi.org/10.1609/aaai.v39i1.32054

Issue

Section

AAAI Technical Track on Application Domains