Leveraging Local Variance for Pseudo-Label Selection in Semi-supervised Learning

Authors

  • Zeping Min Peking University
  • Jinfeng Bai TAL Education Group
  • Chengfei Li TAL Education Group

DOI:

https://doi.org/10.1609/aaai.v38i13.29350

Keywords:

ML: Deep Learning Algorithms, ML: Classification and Regression, ML: Semi-Supervised Learning

Abstract

Semi-supervised learning algorithms that use pseudo-labeling have become increasingly popular for improving model performance by utilizing both labeled and unlabeled data. In this paper, we offer a fresh perspective on the selection of pseudo-labels, inspired by theoretical insights. We suggest that pseudo-labels with a high degree of local variance are more prone to inaccuracies. Based on this premise, we introduce the Local Variance Match (LVM) method, which aims to optimize the selection of pseudo-labels in semi-supervised learning (SSL) tasks. Our methodology is validated through a series of experiments on widely-used image classification datasets, such as CIFAR-10, CIFAR-100, and SVHN, spanning various labeled data quantity scenarios. The empirical findings show that the LVM method substantially outpaces current SSL techniques, achieving state-of-the-art results in many of these scenarios. For instance, we observed an error rate of 5.41% on CIFAR-10 with a single label for each class, 35.87% on CIFAR-100 when using four labels per class, and 1.94% on SVHN with four labels for each class. Notably, the standout error rate of 5.41% is less than 1% shy of the performance in a fully-supervised learning environment. In experiments on ImageNet with 100k labeled data, the LVM also reached state-of-the-art outcomes. Additionally, the efficacy of the LVM method is further validated by its stellar performance in speech recognition experiments.

Published

2024-03-24

How to Cite

Min, Z., Bai, J., & Li, C. (2024). Leveraging Local Variance for Pseudo-Label Selection in Semi-supervised Learning. Proceedings of the AAAI Conference on Artificial Intelligence, 38(13), 14370-14378. https://doi.org/10.1609/aaai.v38i13.29350

Issue

Section

AAAI Technical Track on Machine Learning IV