Elijah: Eliminating Backdoors Injected in Diffusion Models via Distribution Shift

Authors

  • Shengwei An Purdue University
  • Sheng-Yen Chou The Chinese University of Hong Kong
  • Kaiyuan Zhang Purdue University
  • Qiuling Xu Purdue University
  • Guanhong Tao Purdue University
  • Guangyu Shen Purdue University
  • Siyuan Cheng Purdue University
  • Shiqing Ma University of Massachusetts Amherst
  • Pin-Yu Chen IBM Research
  • Tsung-Yi Ho The Chinese University of Hong Kong
  • Xiangyu Zhang Purdue University

DOI:

https://doi.org/10.1609/aaai.v38i10.28958

Keywords:

ML: Adversarial Learning & Robustness, CV: Adversarial Attacks & Robustness, ML: Deep Generative Models & Autoencoders, PEAI: Safety, Robustness & Trustworthiness

Abstract

Diffusion models (DM) have become state-of-the-art generative models because of their capability of generating high-quality images from noises without adversarial training. However, they are vulnerable to backdoor attacks as reported by recent studies. When a data input (e.g., some Gaussian noise) is stamped with a trigger (e.g., a white patch), the backdoored model always generates the target image (e.g., an improper photo). However, effective defense strategies to mitigate backdoors from DMs are underexplored. To bridge this gap, we propose the first backdoor detection and removal framework for DMs. We evaluate our framework Elijah on over hundreds of DMs of 3 types including DDPM, NCSN and LDM, with 13 samplers against 3 existing backdoor attacks. Extensive experiments show that our approach can have close to 100% detection accuracy and reduce the backdoor effects to close to zero without significantly sacrificing the model utility.

Published

2024-03-24

How to Cite

An, S., Chou, S.-Y., Zhang, K., Xu, Q., Tao, G., Shen, G., … Zhang, X. (2024). Elijah: Eliminating Backdoors Injected in Diffusion Models via Distribution Shift. Proceedings of the AAAI Conference on Artificial Intelligence, 38(10), 10847–10855. https://doi.org/10.1609/aaai.v38i10.28958

Issue

Section

AAAI Technical Track on Machine Learning I