Symbolic Brittleness in Sequence Models: On Systematic Generalization in Symbolic Mathematics

Authors

  • Sean Welleck Paul G. Allen School of Computer Science & Engineering, University of Washington Allen Institute for Artificial Intelligence
  • Peter West Paul G. Allen School of Computer Science & Engineering, University of Washington
  • Jize Cao Paul G. Allen School of Computer Science & Engineering, University of Washington
  • Yejin Choi Paul G. Allen School of Computer Science & Engineering, University of Washington Allen Institute for Artificial Intelligence

DOI:

https://doi.org/10.1609/aaai.v36i8.20841

Keywords:

Machine Learning (ML)

Abstract

Neural sequence models trained with maximum likelihood estimation have led to breakthroughs in many tasks, where success is defined by the gap between training and test performance. However, their ability to achieve stronger forms of generalization remains unclear. We consider the problem of symbolic mathematical integration, as it requires generalizing systematically beyond the training set. We develop a methodology for evaluating generalization that takes advantage of the problem domain's structure and access to a verifier. Despite promising in-distribution performance of sequence-to-sequence models in this domain, we demonstrate challenges in achieving robustness, compositionality, and out-of-distribution generalization, through both carefully constructed manual test suites and a genetic algorithm that automatically finds large collections of failures in a controllable manner. Our investigation highlights the difficulty of generalizing well with the predominant modeling and learning approach, and the importance of evaluating beyond the test set, across different aspects of generalization.

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Published

2022-06-28

How to Cite

Welleck, S., West, P., Cao, J., & Choi, Y. (2022). Symbolic Brittleness in Sequence Models: On Systematic Generalization in Symbolic Mathematics. Proceedings of the AAAI Conference on Artificial Intelligence, 36(8), 8629-8637. https://doi.org/10.1609/aaai.v36i8.20841

Issue

Section

AAAI Technical Track on Machine Learning III