Input-Specific Robustness Certification for Randomized Smoothing

Authors

  • Ruoxin Chen Shanghai Jiao Tong University
  • Jie Li Shanghai Jiao Tong University
  • Junchi Yan Shanghai Jiao Tong University
  • Ping Li The Hong Kong Polytechnic University
  • Bin Sheng Shanghai Jiao Tong University

DOI:

https://doi.org/10.1609/aaai.v36i6.20579

Keywords:

Machine Learning (ML), Computer Vision (CV)

Abstract

Although randomized smoothing has demonstrated high certified robustness and superior scalability to other certified defenses, the high computational overhead of the robustness certification bottlenecks the practical applicability, as it depends heavily on the large sample approximation for estimating the confidence interval. In existing works, the sample size for the confidence interval is universally set and agnostic to the input for prediction. This Input-Agnostic Sampling (IAS) scheme may yield a poor Average Certified Radius (ACR)-runtime trade-off which calls for improvement. In this paper, we propose Input-Specific Sampling (ISS) acceleration to achieve the cost-effectiveness for robustness certification, in an adaptive way of reducing the sampling size based on the input characteristic. Furthermore, our method universally controls the certified radius decline from the ISS sample size reduction. The empirical results on CIFAR-10 and ImageNet show that ISS can speed up the certification by more than three times at a limited cost of 0.05 certified radius. Meanwhile, ISS surpasses IAS on the average certified radius across the extensive hyperparameter settings. Specifically, ISS achieves ACR=0.958 on ImageNet in 250 minutes, compared to ACR=0.917 by IAS under the same condition. We release our code in https://github.com/roy-ch/Input-Specific-Certification.

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Published

2022-06-28

How to Cite

Chen, R., Li, J., Yan, J., Li, P., & Sheng, B. (2022). Input-Specific Robustness Certification for Randomized Smoothing. Proceedings of the AAAI Conference on Artificial Intelligence, 36(6), 6295-6303. https://doi.org/10.1609/aaai.v36i6.20579

Issue

Section

AAAI Technical Track on Machine Learning I