Tackling Instance-Dependent Label Noise via a Universal Probabilistic Model

Authors

  • Qizhou Wang Key Laboratory of Intelligent Perception and Systems for High-Dimensional Information of MoE, School of Computer Science and Engineering, Nanjing University of Science and Technology Department of Computer Science, Hong Kong Baptist University
  • Bo Han Department of Computer Science, Hong Kong Baptist University
  • Tongliang Liu Trustworthy Machine Learning Lab, School of Computer Science, Faculty of Engineering, The University of Sydney
  • Gang Niu RIKEN Center for Advanced Intelligence Project (AIP)
  • Jian Yang Key Laboratory of Intelligent Perception and Systems for High-Dimensional Information of MoE, School of Computer Science and Engineering, Nanjing University of Science and Technology
  • Chen Gong Key Laboratory of Intelligent Perception and Systems for High-Dimensional Information of MoE, School of Computer Science and Engineering, Nanjing University of Science and Technology Department of Computing, Hong Kong Polytechnic University

DOI:

https://doi.org/10.1609/aaai.v35i11.17221

Keywords:

(Deep) Neural Network Algorithms, Semi-Supervised Learning

Abstract

The drastic increase of data quantity often brings the severe decrease of data quality, such as incorrect label annotations. It poses a great challenge for robustly training Deep Neural Networks (DNNs). Existing learning methods with label noise either employ ad-hoc heuristics or restrict to specific noise assumptions. However, more general situations, such as instance-dependent label noise, have not been fully explored, as scarce studies focus on their label corruption process. By categorizing instances into confusing and unconfusing instances, this paper proposes a simple yet universal probabilistic model, which explicitly relates noisy labels to their instances. The resultant model can be realized by DNNs, where the training procedure is accomplished by employing a novel alternating optimization algorithm. Experiments on datasets with both synthetic and real-world label noise verify the proposed method yields significant improvements on robustness over state-of-the-art counterparts.

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Published

2021-05-18

How to Cite

Wang, Q., Han, B., Liu, T., Niu, G., Yang, J., & Gong, C. (2021). Tackling Instance-Dependent Label Noise via a Universal Probabilistic Model. Proceedings of the AAAI Conference on Artificial Intelligence, 35(11), 10183-10191. https://doi.org/10.1609/aaai.v35i11.17221

Issue

Section

AAAI Technical Track on Machine Learning IV