Efficient Nonparametric Subgraph Detection Using Tree Shaped Priors

Authors

  • Nannan Wu Beihang University
  • Feng Chen State University of New York, Albany
  • Jianxin Li Beihang University
  • Baojian Zhou State University of New York, Albany
  • Naren Ramakrishnan Virginia Polytechnic Institute and State University

DOI:

https://doi.org/10.1609/aaai.v30i1.10182

Keywords:

Scan Statistics, Connected Subgraph Detection, Anomalous Pattern Detection, Event Detection

Abstract

Non-parametric graph scan (NPGS) statistics are used to detect anomalous connected subgraphs on graphs, and have a wide variety of applications, such as disease outbreak detection, road traffic congestion detection, and event detection in social media. In contrast to traditional parametric scan statistics (e.g., the Kulldorff statistic), NPGS statistics are free of distributional assumptions and can be applied to heterogeneous graph data. In this paper, we make a number of contributions to the computational study of NPGS statistics. First, we present a novel reformulation of the problem as a sequence of Budget Price-Collecting Steiner Tree (B-PCST) sub-problems. Second, we show that this reformulated problem is NP-hard for a large class of nonparametric statistic functions. Third, we further develop efficient exact and approximate algorithms for a special category of graphs in which the anomalous subgraphs can be reformulated in a fixed tree topology. Finally, using extensive experiments we demonstrate the performance of our proposed algorithms in two real-world application domains (water pollution detection in water sensor networks and spatial event detection in social media networks) and contrast against state-of-the-art connected subgraph detection methods.

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Published

2016-02-21

How to Cite

Wu, N., Chen, F., Li, J., Zhou, B., & Ramakrishnan, N. (2016). Efficient Nonparametric Subgraph Detection Using Tree Shaped Priors. Proceedings of the AAAI Conference on Artificial Intelligence, 30(1). https://doi.org/10.1609/aaai.v30i1.10182

Issue

Section

Technical Papers: Machine Learning Applications